Out-of-Plane Motion Effects in Microscopic Particle Image Velocimetry

[+] Author and Article Information
Michael G. Olsen

Department of Mechanical Engineering, Iowa State University, 3025 H. M. Black Engineering, Ames, IA 50011e-mail: mgolsen@iastate.edu

Chris J. Bourdon

Senior Member Technical Staff, Engineering Sciences Center, Thermal, Fluids and Aero Experimental Sciences, Sandia National Laboratories, P.O. Box 5800, MS 0834, Albuquerque, NM 87145e-mail: cjbourd@sandia.gov

J. Fluids Eng 125(5), 895-901 (Oct 07, 2003) (7 pages) doi:10.1115/1.1598989 History: Received April 23, 2002; Revised April 14, 2003; Online October 07, 2003
Copyright © 2003 by ASME
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Diagram of a microscope-based microPIV system
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Depth of correlation as a function of out-of-plane particle motion
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Decrease in correlation signal peak height as a function of out-of-plane motion for 0.5 μm seed particles and various microscopic objectives
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Actual (left) and synthetic (right) microPIV images for the same specified conditions




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