Statistical Approach for Estimating Intervals of Certification or Biases of Facilities or Measurement Systems Including Uncertainties

[+] Author and Article Information
F. Stern, J. Shao, J. Longo

IIHR Hydroscience and Engineering,  The University of Iowa, Iowa City, IA 52242

A. Olivieri

 INSEAN, Italian Ship Model Basin, Rome, Italy

T. Ratcliffe

 NSWC/CD, David Taylor Model Basin, Bethesda, MD

J. Fluids Eng 127(3), 604-610 (Feb 10, 2005) (7 pages) doi:10.1115/1.1906269 History: Received April 08, 2003; Revised February 10, 2005

A statistical approach for estimating intervals of certification or biases of facilities or measurement systems including uncertainties is set forth based on M×N-order level testing, which is defined as M repetitions of the same N-order level experiment in M different facilities or in the same facility with M different measurement systems. In the absence of reference values, the mean facility or measurement system is used for assessing intervals of certification or biases. Certification or biases of facilities or measurement systems are defined as processes for assessing probabilistic confidence intervals for facilities or measurement systems for specific tests, data reduction equations, conditions, procedures, and uncertainty analysis. Similarly, subgroup analysis is performed for isolating and assessing levels of differences due to use of different model sizes (scale effects) or measurement systems. An example is provided for towing tank facilities for resistance tests using standard uncertainty analysis procedures based on an international collaboration between three facilities. Although the number of facilities are at a minimum, the results demonstrate the usefulness of an approach and support recommendation of future collaborations between more facilities. Knowledge of intervals of certification or biases is important for design, accrediting facilities or measurement systems, and CFD validation.

Copyright © 2005 by American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.



Grahic Jump Location
Figure 1

M×N-order level testing

Grahic Jump Location
Figure 2

Estimating intervals of certification or biases of facilities using mean as reference value: facility i certified at UDi and facility j with facility bias UFBj

Grahic Jump Location
Figure 3

Surface-combatant model ships (a) DTMB model 5415 (b) INSEAN model 2340A (c) IIHR model 5512

Grahic Jump Location
Figure 4

Individual facility residuary resistance results and mean facility residuary resistance and individual facility uncertainty bands at Fr=0.1, 0.28, and 0.41.




Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In