The preparation of specimens for cryo-electron microscopy is currently a labor and time intensive process, and the quality of resulting samples is highly dependent on both environmental and procedural factors. Specimens must be applied to sample grids in a high-humidity environment, frozen in liquid ethane, and stored in liquid nitrogen. The combination of cryogenic temperatures and humidity-control mandates the segregation of the humidity-controlled environment from the cryogenic environment. Several devices which automate portions of the specimen preparation process are currently in use; however, these systems still require significant human interaction in order to create viable samples. This paper describes a fully automated system for specimen preparation. The resulting system removes the need for human input during specimen preparation, improves process control, and provides similar levels of environmental control. Early testing shows that the resulting system is capable of manipulating samples in an autonomous manner while providing performance similar to existing systems.
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ASME 2010 Dynamic Systems and Control Conference
September 12–15, 2010
Cambridge, Massachusetts, USA
Conference Sponsors:
- Dynamic Systems and Control Division
ISBN:
978-0-7918-4417-5
PROCEEDINGS PAPER
A Fully Automated System for the Preparation of Samples for Cryo-Electron Microscopy
Zachary J. Thompson,
Zachary J. Thompson
Rice University, Houston, TX
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Kevin L. Johnson, Jr.,
Kevin L. Johnson, Jr.
Rice University, Houston, TX
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Nicolas Overby,
Nicolas Overby
Rice University, Houston, TX
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Jessica I. Chidi,
Jessica I. Chidi
Rice University, Houston, TX
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William K. Pryor,
William K. Pryor
Rice University, Houston, TX
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Marcia K. O’Malley
Marcia K. O’Malley
Rice University, Houston, TX
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Zachary J. Thompson
Rice University, Houston, TX
Kevin L. Johnson, Jr.
Rice University, Houston, TX
Nicolas Overby
Rice University, Houston, TX
Jessica I. Chidi
Rice University, Houston, TX
William K. Pryor
Rice University, Houston, TX
Marcia K. O’Malley
Rice University, Houston, TX
Paper No:
DSCC2010-4272, pp. 459-465; 7 pages
Published Online:
January 25, 2011
Citation
Thompson, ZJ, Johnson, KL, Jr., Overby, N, Chidi, JI, Pryor, WK, & O’Malley, MK. "A Fully Automated System for the Preparation of Samples for Cryo-Electron Microscopy." Proceedings of the ASME 2010 Dynamic Systems and Control Conference. ASME 2010 Dynamic Systems and Control Conference, Volume 1. Cambridge, Massachusetts, USA. September 12–15, 2010. pp. 459-465. ASME. https://doi.org/10.1115/DSCC2010-4272
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