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Proceedings Papers

Determination of Adhesion Forces Between Smooth and Structured Solids

Hartmut R. Fischer, Edwin R. M. Gelinck
Proc. ASME. IJTC2012, ASME/STLE 2012 International Joint Tribology Conference, 17-20, October 7–10, 2012
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2012-61132
https://doi.org/10.1115/IJTC2012-61132
View Paper titled, Determination of Adhesion Forces Between Smooth and Structured Solids
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Topics: Adhesion, Solids, Particulate matter, Atomic force microscopy, Probes, Contamination, Wear, Cantilevers, Finishes, Machinery
Proceedings Papers

Design of a Composite Microtribology Experiment System for Silicon Sidewalls

Wei Zhang, Sihan Shen, Yonggang Meng
Proc. ASME. IJTC2010, STLE/ASME 2010 International Joint Tribology Conference, 25-27, October 17–20, 2010
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2010-41218
https://doi.org/10.1115/IJTC2010-41218
View Paper titled, Design of a Composite Microtribology Experiment System for Silicon Sidewalls
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Topics: Composite materials, Design, Microtribology, Silicon, Friction, Cantilevers, Lasers, Displacement, Information processing systems, Microscopes
Proceedings Papers

Analysis of Topographical Changes and Adhesion Failures in Gold-to-Gold Metal RF MEMS Switches With Cycling

Seung Min Yeo, Spyros I. Tseregounis, Andreas A. Polycarpou, Adam Fruehling, Dimitrios Peroulis
Proc. ASME. IJTC2009, ASME/STLE 2009 International Joint Tribology Conference, 13-15, October 19–21, 2009
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2009-15120
https://doi.org/10.1115/IJTC2009-15120
View Paper titled, Analysis of Topographical Changes and Adhesion Failures in Gold-to-Gold Metal RF MEMS Switches With Cycling
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Topics: Adhesion, Failure, Metals, Microelectromechanical systems, Switches, Cycles, Atomic force microscopy, Cantilevers, Optical microscopy, Reliability
Proceedings Papers

Quantification of Friction Force for Dual-Axis Probe Friction Force Microscope

Hiroaki Amakawa, Kenji Fukuzawa, Mitsuhiro Shikida, Hedong Zhang, Shitaro Itoh
Proc. ASME. IJTC2009, ASME/STLE 2009 International Joint Tribology Conference, 39-41, October 19–21, 2009
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2009-15241
https://doi.org/10.1115/IJTC2009-15241
View Paper titled, Quantification of Friction Force for Dual-Axis Probe Friction Force Microscope
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Topics: Friction, Microscopes, Probes, Calibration, Torsion, Cantilevers, Deflection
Proceedings Papers

Optimum Roughness for Minimum Adhesion

D.-L. Liu, J. Martin, N. A. Burnham
Proc. ASME. IJTC2008, STLE/ASME 2008 International Joint Tribology Conference, 593-595, October 20–22, 2008
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2008-71192
https://doi.org/10.1115/IJTC2008-71192
View Paper titled, Optimum Roughness for Minimum Adhesion
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Topics: Adhesion, Surface roughness, Adhesives, Atomic force microscopy, Fractals, Cantilevers, Computer software, Contact mechanics, Microelectromechanical systems, Nanoscale phenomena
Proceedings Papers

Temperature Dependent Nanotribological Behavior of Ultrathin Thermoplastic Polymeric Resist Films Studied by Use of AFM

Adam Koszewski, Freimut Reuther, Zygmunt Rymuza
Proc. ASME. IJTC2007, ASME/STLE 2007 International Joint Tribology Conference, Parts A and B, 795-797, October 22–24, 2007
Publisher: American Society of Mechanical Engineers
Paper No: IJTC2007-44138
https://doi.org/10.1115/IJTC2007-44138
View Paper titled, Temperature Dependent Nanotribological Behavior of Ultrathin Thermoplastic Polymeric Resist Films Studied by Use of AFM
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Topics: Atomic force microscopy, Temperature, Polymers, Cantilevers, Embossing, Lithography, Manufacturing, Resolution (Optics), Silicon, Testing
Proceedings Papers

AFM-Based Testing and Measurements of Contact and Stiction in a Micromechanical Switch

Lei Chen, Nicol E. McGruer, George G. Adams
Proc. ASME. TRIB2004, ASME/STLE 2004 International Joint Tribology Conference, Parts A and B, 65-68, October 24–27, 2004
Publisher: American Society of Mechanical Engineers
Paper No: TRIB2004-64348
https://doi.org/10.1115/TRIB2004-64348
View Paper titled, AFM-Based Testing and Measurements of Contact and Stiction in a Micromechanical Switch
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Topics: Atomic force microscopy, Stiction, Switches, Testing, Cantilevers, Scanning probe microscopy, Contact resistance, Physics, Stiffness