... under Grant No. DMR-0312189. The X-ray diffraction experiments were carried out on beamline 34-ID at the Advanced Photon Source, Argonne National Laboratory, which is supported by the United States Department of Energy. X-ray microbeam measurements of deviatoric strain in an Al film subjected...

... discontinuous metallic thin films X-ray diffraction curvature measurement deformation stress measurement microsensors As the semiconductor industry develops ever smaller dimensions of thin metal film interconnections and more complex multilayered (film stack) structures, the mechanical properties...

... finite element analysis plasticity internal stresses X-ray diffraction crystal orientation stress measurement Shot peening is a process involving multiple and repeated impacts by bombarding a surface with relatively hard particles with sufficient velocities to indent the surface, 1 . Shot...