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Journal Articles

Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing

Fakhreddine Landolsi, Fathi H. Ghorbel, James B. Dabney
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research-Article
J. Dyn. Sys., Meas., Control. January 2013, 135(1): 011002.
Paper No: DS-09-1341
https://doi.org/10.1115/1.4006370
Published Online: October 30, 2012
View Article titled, Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing
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Topics: Adhesion, Atomic force microscopy, Friction, Nanoscale phenomena
Journal Articles

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

R. Parker Eason, Andrew J. Dick
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. January 2012, 134(1): 011010.
https://doi.org/10.1115/1.4005361
Published Online: December 5, 2011
View Article titled, Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy
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Topics: Accuracy and precision, Atomic force microscopy, Displacement, Errors, Excitation, Probes, Resonance, Calibration, Lasers, Displacement measurement
Journal Articles

Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale

Nader Jalili, Laxman Saggere, Arvind Raman
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Guest Editorial
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 060301.
https://doi.org/10.1115/1.4000554
Published Online: November 10, 2009
View Article titled, Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale
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Topics: Atomic force microscopy, Control modeling, Dynamic modeling, Nanoscale phenomena, Scanning probe microscopy, Modeling, Manipulators, Nanoelectromechanical devices
Journal Articles

DMCMN: In Depth Characterization and Control of AFM Cantilevers With Integrated Sensing and Actuation

Georg E. Fantner, Daniel J. Burns, Angela M. Belcher, Ivo W. Rangelow, Kamal Youcef-Toumi
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061104.
https://doi.org/10.1115/1.4000378
Published Online: November 6, 2009
View Article titled, DMCMN: In Depth Characterization and Control of AFM Cantilevers With Integrated Sensing and Actuation
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Topics: Actuators, Atomic force microscopy, Cantilevers, Deflection, Imaging
Journal Articles

An Iterative-Based Feedforward-Feedback Control Approach to High-Speed Atomic Force Microscope Imaging

Ying Wu, Qingze Zou
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061105.
https://doi.org/10.1115/1.4000137
Published Online: November 6, 2009
View Article titled, An Iterative-Based Feedforward-Feedback Control Approach to High-Speed Atomic Force Microscope Imaging
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Topics: Atomic force microscopy, Feedback, Imaging, Iterative learning control, Errors, Feedforward control, Design
Journal Articles

Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

Florian Krohs, Cagdas Onal, Metin Sitti, Sergej Fatikow
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061106.
https://doi.org/10.1115/1.4000139
Published Online: November 6, 2009
View Article titled, Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure
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Topics: Algorithms, Atomic force microscopy, Filters, Particulate matter, Sensors, Uncertainty, Displacement
Journal Articles

Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment

Amin Salehi-Khojin, Saeid Bashash, Nader Jalili, Gary Lee Thompson, Alexey Vertegel
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061107.
https://doi.org/10.1115/1.4000161
Published Online: November 6, 2009
View Article titled, Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment
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Topics: Differential equations, Elastic constants, Frequency response, Microscopy, Modal analysis, Modeling, Parameter estimation, Piezoelectric materials, Stiffness, Resonance
Journal Articles

Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes

Ugur Aridogan, Yingfeng Shan, Kam K. Leang
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061103.
https://doi.org/10.1115/1.4000068
Published Online: October 30, 2009
View Article titled, Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes
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Topics: Atomic force microscopy, Control equipment, Design, Errors, Feedback, Imaging, Stability, Scanning probe microscopy, Robustness, Simulation
Journal Articles

DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration

Matthew S. Allen, Hartono Sumali, Peter C. Penegor
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 064501.
https://doi.org/10.1115/1.4000160
Published Online: October 30, 2009
View Article titled, DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration
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Topics: Atomic force microscopy, Calibration, Cantilevers, Probes, Errors, Elastic constants, Mode shapes, Stiffness, Density
Journal Articles

A New Approach to Scan-Trajectory Design and Track: AFM Force Measurement Example

Kyong-Soo Kim, Qingze Zou, Chanmin Su
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. September 2008, 130(5): 051005.
https://doi.org/10.1115/1.2936841
Published Online: August 1, 2008
View Article titled, A New Approach to Scan-Trajectory Design and Track: AFM Force Measurement Example
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Topics: Adhesion, Atomic force microscopy, Design, Dynamics (Mechanics), Errors, Oscillations, Trajectories (Physics), Piezoelectric actuators, Force measurement, Algorithms
Journal Articles

Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope

Deman Tang, Earl H. Dowell
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. September 2004, 126(3): 531–546.
https://doi.org/10.1115/1.1789969
Published Online: December 3, 2004
View Article titled, Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope
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Topics: Atomic force microscopy, Chain, Dynamic response, Equilibrium (Physics), Excitation, Linear systems, Proteins, Errors
Journal Articles

Dynamic Responses of an Atomic Force Microscope Interacting with Samples

Jih-Lian Ha, Rong-Fong Fung, Yi-Chan Chen
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. December 2005, 127(4): 705–709.
https://doi.org/10.1115/1.2101851
Published Online: October 17, 2004
View Article titled, Dynamic Responses of an Atomic Force Microscope Interacting with Samples
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Topics: Atomic force microscopy, Cantilever beams, Dynamic response, Deformation, Hamilton's principle, Piezoelectric actuators
Journal Articles

A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy

Nader Jalili, Mohsen Dadfarnia, Darren M. Dawson
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. June 2004, 126(2): 327–335.
https://doi.org/10.1115/1.1767852
Published Online: August 5, 2004
View Article titled, A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy
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Topics: Atomic force microscopy, Modeling
Journal Articles

Optimal Control of Arrays of Microcantilevers

Mariateresa Napoli, Bassam Bamieh, Mohammed Dahleh
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. December 1999, 121(4): 686–690.
https://doi.org/10.1115/1.2802535
Published Online: December 1, 1999
View Article titled, Optimal Control of Arrays of Microcantilevers
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Topics: Microcantilevers, Optimal control, Control equipment, Sensors, Actuators, Atomic force microscopy, Design, Manufacturing, Nanoscale phenomena
Journal Articles

Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application

D. Croft, G. Shed, S. Devasia
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. March 2001, 123(1): 35–43.
https://doi.org/10.1115/1.1341197
Published Online: November 19, 1999
View Article titled, Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application
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Topics: Atomic force microscopy, Creep, Modeling, Vibration, Dynamics (Mechanics), Scanning probe microscopy
Journal Articles

Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes

M. Basso, L. Giarre´, M. Dahleh, I. Mezic´
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. March 2000, 122(1): 240–245.
https://doi.org/10.1115/1.482465
Published Online: January 30, 1998
View Article titled, Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes
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Topics: Atomic force microscopy, Attractors, Dynamics (Mechanics), Scanning probe microscopy, Numerical analysis, Lennard-Jones potential, Dimensions, Chaos
Journal Articles

Study on a Surface-Motor Driven Precise Positioning System

Yoshiyuki Tomita, Yasushi Koyanagawa
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. September 1995, 117(3): 311–319.
https://doi.org/10.1115/1.2799121
Published Online: September 1, 1995
View Article titled, Study on a Surface-Motor Driven Precise Positioning System
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Topics: Motors, Atomic force microscopy, Air bearings, Degrees of freedom, Design, Feedback, Interferometers, Lasers, Permeability, Resolution (Optics)