This paper presents a methodology for the design and optimization of cooling systems for electronic equipment. In this approach, inputs from both experimentation and numerical modeling are to be used concurrently to obtain an acceptable or optimal design. The experimental conditions considered are driven by the numerical simulation and vice versa. Thus, the two approaches are employed in conjunction, rather than separately, as is the case in traditional design methods. Numerical simulation is used to consider different geometries, materials, and dimensions, whereas experiments are used for obtaining results for different flow rates and heat inputs, as these can often be varied more easily in experiments than in simulations. Also, transitional and turbulent flows are more accurately and more conveniently investigated experimentally. Thus, by using both approaches concurrently, the entire design domain is covered, leading to a rapid, convergent, and realistic design process. Two simple configurations of electronic cooling systems are used to demonstrate this approach.
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December 2004
Research Papers
Design of Cooling Systems for Electronic Equipment Using Both Experimental and Numerical Inputs
Tunc Icoz,
Tunc Icoz
Department of Mechanical Engineering, Rutgers University, New Brunswick, NJ 08903
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Yogesh Jaluria
Yogesh Jaluria
Department of Mechanical Engineering, Rutgers University, New Brunswick, NJ 08903
Search for other works by this author on:
Tunc Icoz
Department of Mechanical Engineering, Rutgers University, New Brunswick, NJ 08903
Yogesh Jaluria
Department of Mechanical Engineering, Rutgers University, New Brunswick, NJ 08903
Manuscript received April 27, 2004; revision received May 31, 2004. Review conducted by: B. Sammakia.
J. Electron. Packag. Dec 2004, 126(4): 465-471 (7 pages)
Published Online: January 24, 2005
Article history
Received:
April 27, 2004
Revised:
May 31, 2004
Online:
January 24, 2005
Citation
Icoz , T., and Jaluria, Y. (January 24, 2005). "Design of Cooling Systems for Electronic Equipment Using Both Experimental and Numerical Inputs ." ASME. J. Electron. Packag. December 2004; 126(4): 465–471. https://doi.org/10.1115/1.1827262
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