This paper reports on novel thermal testbeds with embedded micropin-fin heat sinks that were designed and microfabricated in silicon. Two micropin-fin arrays were presented, each with a nominal pin height of 200 μm and pin diameters of 90 μm and 30 μm. Single-phase and two-phase thermal testing of the micropin-fin array heat sinks were performed using de-ionized (DI) water as the coolant. The tested mass flow rate was 0.001 kg/s, and heat flux ranged from 30 W/cm2 to 470 W/cm2. The maximum heat transfer coefficient reached was 60 kW/m2 K. The results obtained from the two testbeds were compared and analyzed, showing that density of the micropin-fins has a significant impact on thermal performance. The convective thermal resistance in the single-phase region was calculated and fitted to an empirical model. The model was then used to explore the tradeoff between the electrical and thermal performance in heat sink design.
Skip Nav Destination
Article navigation
March 2016
Research-Article
Three-Dimensional Integrated Circuit With Embedded Microfluidic Cooling: Technology, Thermal Performance, and Electrical Implications
Xuchen Zhang,
Xuchen Zhang
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
e-mail: xzhang96@gatech.edu
Georgia Institute of Technology,
Atlanta, GA 30332
e-mail: xzhang96@gatech.edu
Search for other works by this author on:
Xuefei Han,
Xuefei Han
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Thomas E. Sarvey,
Thomas E. Sarvey
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Craig E. Green,
Craig E. Green
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Peter A. Kottke,
Peter A. Kottke
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Andrei G. Fedorov,
Andrei G. Fedorov
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Yogendra Joshi,
Yogendra Joshi
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Muhannad S. Bakir
Muhannad S. Bakir
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Search for other works by this author on:
Xuchen Zhang
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
e-mail: xzhang96@gatech.edu
Georgia Institute of Technology,
Atlanta, GA 30332
e-mail: xzhang96@gatech.edu
Xuefei Han
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Thomas E. Sarvey
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Craig E. Green
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Peter A. Kottke
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Andrei G. Fedorov
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Yogendra Joshi
G. W. Woodruff School of Mechanical Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
Muhannad S. Bakir
School of Electrical and Computer Engineering,
Georgia Institute of Technology,
Atlanta, GA 30332
Georgia Institute of Technology,
Atlanta, GA 30332
1Corresponding author.
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received October 2, 2015; final manuscript received January 3, 2016; published online March 10, 2016. Assoc. Editor: Jeffrey C. Suhling.
J. Electron. Packag. Mar 2016, 138(1): 010910 (9 pages)
Published Online: March 10, 2016
Article history
Received:
October 2, 2015
Revised:
January 3, 2016
Citation
Zhang, X., Han, X., Sarvey, T. E., Green, C. E., Kottke, P. A., Fedorov, A. G., Joshi, Y., and Bakir, M. S. (March 10, 2016). "Three-Dimensional Integrated Circuit With Embedded Microfluidic Cooling: Technology, Thermal Performance, and Electrical Implications." ASME. J. Electron. Packag. March 2016; 138(1): 010910. https://doi.org/10.1115/1.4032496
Download citation file:
Get Email Alerts
Anand Model Constants of Sn–Ag–Cu Solders: What Do They Actually Mean?
J. Electron. Packag (June 2025)
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag (June 2025)
Related Articles
Embedded Two-Phase Cooling of High Flux Electronics Via Press-Fit and Bonded FEEDS Coolers
J. Electron. Packag (September,2018)
Parametric Analysis of Microfluidic Cooling Systems for Three-Dimensional-Stacked Silicon Microelectronics by Inferential Statistic Approaches
J. Heat Transfer (April,2021)
Thermal-Hydraulic Performance of MEMS-based Pin Fin Heat
Sink
J. Heat Transfer (February,2006)
Flow Boiling Heat Transfer and Pressure Drops of R1234ze(E) in a Silicon Micro-pin Fin Evaporator
J. Electron. Packag (September,2017)
Related Proceedings Papers
Related Chapters
Introduction
Thermal Management of Microelectronic Equipment
Cooling of a Chip Utilizing a Heat Sink with Rectangular Fins
Everyday Heat Transfer Problems: Sensitivities to Governing Variables
System Thermal Analysis-Rack (Part II)
Thermal Management of Telecommunication Equipment, Second Edition