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Technical Papers

J. Electron. Packag. September 2001, 123(3): 165–172. doi: https://doi.org/10.1115/1.1371923
J. Electron. Packag. September 2001, 123(3): 173–181. doi: https://doi.org/10.1115/1.1377271
J. Electron. Packag. September 2001, 123(3): 182–188. doi: https://doi.org/10.1115/1.1347993
J. Electron. Packag. September 2001, 123(3): 189–195. doi: https://doi.org/10.1115/1.1348010
J. Electron. Packag. September 2001, 123(3): 196–199. doi: https://doi.org/10.1115/1.1347987
J. Electron. Packag. September 2001, 123(3): 200–210. doi: https://doi.org/10.1115/1.1348337
J. Electron. Packag. September 2001, 123(3): 211–217. doi: https://doi.org/10.1115/1.1370376
J. Electron. Packag. September 2001, 123(3): 218–224. doi: https://doi.org/10.1115/1.1362674
J. Electron. Packag. September 2001, 123(3): 225–231. doi: https://doi.org/10.1115/1.1348012
J. Electron. Packag. September 2001, 123(3): 232–237. doi: https://doi.org/10.1115/1.1349423
J. Electron. Packag. September 2001, 123(3): 238–246. doi: https://doi.org/10.1115/1.1371232
J. Electron. Packag. September 2001, 123(3): 247–253. doi: https://doi.org/10.1115/1.1371781
J. Electron. Packag. September 2001, 123(3): 254–259. doi: https://doi.org/10.1115/1.1348019
J. Electron. Packag. September 2001, 123(3): 260–267. doi: https://doi.org/10.1115/1.1349422
J. Electron. Packag. September 2001, 123(3): 268–272. doi: https://doi.org/10.1115/1.1349421
J. Electron. Packag. September 2001, 123(3): 273–277. doi: https://doi.org/10.1115/1.1347986
J. Electron. Packag. September 2001, 123(3): 278–283. doi: https://doi.org/10.1115/1.1372319

Papers on Reliability

J. Electron. Packag. September 2001, 123(3): 284–289. doi: https://doi.org/10.1115/1.1371782
J. Electron. Packag. September 2001, 123(3): 290–294. doi: https://doi.org/10.1115/1.1347997
J. Electron. Packag. September 2001, 123(3): 295–301. doi: https://doi.org/10.1115/1.1348338
J. Electron. Packag. September 2001, 123(3): 302–308. doi: https://doi.org/10.1115/1.1362673

Technical Briefs

J. Electron. Packag. September 2001, 123(3): 309–311. doi: https://doi.org/10.1115/1.1371925
J. Electron. Packag. September 2001, 123(3): 311–315. doi: https://doi.org/10.1115/1.1371780
J. Electron. Packag. September 2001, 123(3): 315–318. doi: https://doi.org/10.1115/1.1371924

Book Review

J. Electron. Packag. September 2001, 123(3): 319. doi: https://doi.org/10.1115/1.1387243
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