Skip Nav Destination
Issues
September 2006
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
J. Electron. Packag. September 2006, 128(3): 177–183.
doi: https://doi.org/10.1115/1.2227057
Topics:
Adhesives
,
Contact resistance
,
Finite element methods
,
Flip-chip devices
,
Reliability
,
Simulation
,
Stress
,
Temperature
,
Warping
,
Flip-chip
A Model for Assessing the Shape of Solder Joints in the Presence of PCB and Package Warpage
J. Electron. Packag. September 2006, 128(3): 184–191.
doi: https://doi.org/10.1115/1.2227058
Topics:
Shapes
,
Solder joints
,
Solders
,
Warping
,
Equilibrium (Physics)
An Evaluation of Gold and Copper Wire Bonds on Shear and Pull Testing
J. Electron. Packag. September 2006, 128(3): 192–201.
doi: https://doi.org/10.1115/1.2229214
Topics:
Bonding
,
Copper
,
Fracture (Materials)
,
Shear (Mechanics)
,
Wire
,
Fracture (Process)
,
Testing
,
Aluminum
,
Stress
,
Displacement
Experimental Study of Void Formation in Eutectic and Lead-Free Solder Bumps of Flip-Chip Assemblies
J. Electron. Packag. September 2006, 128(3): 202–207.
doi: https://doi.org/10.1115/1.2229215
Topics:
Cooling
,
Heating
,
Lead-free solders
,
Solders
,
Flip-chip assemblies
Discussion on the Reliability Issues of Solder-Bump and Direct-Solder Bonded Power Device Packages Having Double-Sided Cooling Capability
J. Electron. Packag. September 2006, 128(3): 208–214.
doi: https://doi.org/10.1115/1.2229218
Topics:
Cooling
,
Finite element analysis
,
Reliability
,
Solders
,
Temperature
,
Stress
,
Thermomechanics
,
Thermal expansion
Electronics Packaging Cooling: Technologies From Gas Turbine Engine Cooling
J. Electron. Packag. September 2006, 128(3): 215–225.
doi: https://doi.org/10.1115/1.2229219
Topics:
Cooling
,
Flow (Dynamics)
,
Heat transfer
,
Gas turbines
,
Heat sinks
,
Turbines
Study of Flow and Heat Transfer Characteristics in Asymmetrically Heated Sintered Porous Heat Sinks With Periodical Baffles
J. Electron. Packag. September 2006, 128(3): 226–235.
doi: https://doi.org/10.1115/1.2229220
Topics:
Flow (Dynamics)
,
Heat sinks
,
Heat transfer
,
Porous materials
,
Fluids
,
Reynolds number
,
Heat conduction
Fabrication and Characterization of Flexible Substrates for Use in the Development of Miniaturized Wireless Sensor Network Modules
J. Electron. Packag. September 2006, 128(3): 236–245.
doi: https://doi.org/10.1115/1.2229221
Topics:
Circuits
,
Copper
,
Manufacturing
,
Packaging
,
Polymers
,
Semiconductor wafers
,
Stiffness
,
Stress
,
Wireless sensor networks
,
Lasers
The Effects of Multiple Zincation Process on Aluminum Bond Pad Surface for Electroless Nickel Immersion Gold Deposition
J. Electron. Packag. September 2006, 128(3): 246–250.
doi: https://doi.org/10.1115/1.2229223
Topics:
Adhesion
,
Aluminum
,
Atomic force microscopy
,
Nickel
,
Shear strength
,
Solders
,
Focused ion beams
,
Metallurgy
,
Scanning electron microscopy
,
X-rays
Heightened Thermal Convection as a Result of Splitting a Square Cavity Diagonally in Half
J. Electron. Packag. September 2006, 128(3): 251–258.
doi: https://doi.org/10.1115/1.2229224
Topics:
Cavities
,
Temperature
,
Convection
Metal Foam and Finned Metal Foam Heat Sinks for Electronics Cooling in Buoyancy-Induced Convection
J. Electron. Packag. September 2006, 128(3): 259–266.
doi: https://doi.org/10.1115/1.2229225
Topics:
Aluminum
,
Buoyancy
,
Computer cooling
,
Convection
,
Heat sinks
,
Metal foams
,
Porous materials
Numerical Thermal Simulation of Cryogenic Power Modules Under Liquid Nitrogen Cooling
J. Electron. Packag. September 2006, 128(3): 267–272.
doi: https://doi.org/10.1115/1.2229226
Topics:
Cooling
,
Heat
,
MOSFET transistors
,
Nitrogen
,
Simulation
,
Temperature
,
Critical heat flux
,
Junctions
,
Energy dissipation
,
Boiling
Laminar Heat Transfer in Constructal Microchannel Networks With Loops
J. Electron. Packag. September 2006, 128(3): 273–280.
doi: https://doi.org/10.1115/1.2229228
Topics:
Damage
,
Disks
,
Flow (Dynamics)
,
Heat sinks
,
Heat transfer
,
Microchannels
,
Pressure drop
,
Temperature
,
Temperature distribution
,
Fluids
Transient Thermal Analysis for Board-Level Chip-Scale Packages Subjected to Coupled Power and Thermal Cycling Test Conditions
J. Electron. Packag. September 2006, 128(3): 281–284.
doi: https://doi.org/10.1115/1.2229229
Heat Sinks With Enhanced Heat Transfer Capability for Electronic Cooling Applications
J. Electron. Packag. September 2006, 128(3): 285–290.
doi: https://doi.org/10.1115/1.2229230
Topics:
Fins
,
Heat sinks
,
Heat transfer
,
Pressure drop
Technical Briefs
A Three-Dimensional Solder Shape Model Incorporating Top Pad Inclination and Misalignment
J. Electron. Packag. September 2006, 128(3): 291–293.
doi: https://doi.org/10.1115/1.2229232
Topics:
Shapes
,
Solder joints
,
Solders
Influence of the Fluid on the Experimental Performances of Triangular Silicon Microheat Pipes
J. Electron. Packag. September 2006, 128(3): 294–296.
doi: https://doi.org/10.1115/1.2229233
Topics:
Fluids
,
Methanol
,
Microchannels
,
Pipes
,
Silicon
,
Thermal conductivity
,
Semiconductor wafers
,
Water
,
Bonding
,
Ethanol
Reliability of Lead-Free Solder Joints
J. Electron. Packag. September 2006, 128(3): 297–301.
doi: https://doi.org/10.1115/1.2229234
Topics:
Lead-free solders
,
Reliability
,
Solder joints
,
Solders
Email alerts
RSS Feeds
Anand Model Constants of Sn–Ag–Cu Solders: What Do They Actually Mean?
J. Electron. Packag (June 2025)
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag (June 2025)