1-13 of 13
Keywords: Nanotechnolgy
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2018, 140(3): 031006.
Paper No: EP-17-1110
Published Online: June 11, 2018
... in conducting heat to the heatsink [ 4 – 6 ]. Composite materials Conductive adhesives Harsh environment Nanotechnolgy Reliability Thermal analysis 15 10 2017 09 04 2018 Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the J OURNAL OF E...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2017, 139(3): 031001.
Paper No: EP-15-1102
Published Online: June 14, 2017
... environment MEMS Microsystems Nanotechnolgy PWB Reliability SMT The ever increasing portability, miniaturization, and functionality of consumer electronic products have driven the move to thinner printed wiring assemblies (PWAs) and smaller clearances between adjacent components. Accidental drop...
Journal Articles
Publisher: ASME
Article Type: Review Articles
J. Electron. Packag. June 2017, 139(2): 020801.
Paper No: EP-16-1131
Published Online: June 13, 2017
... December 1, 2016; final manuscript received February 22, 2017; published online June 13, 2017. Assoc. Editor: Xiaobing Luo. 01 12 2016 22 02 2017 Composite materials Electronic Flexible circuits Nanotechnolgy Given the rapid recent development in heterogeneous integration...
Journal Articles
Publisher: ASME
Article Type: Guest Editorial
J. Electron. Packag. June 2017, 139(2): 020301.
Paper No: EP-17-1032
Published Online: June 12, 2017
...Justin A. Weibel; S. Ravi Annapragada 22 03 2017 31 03 2017 3D packaging Backplanes Chip stacking Failure analysis Flexible circuits Nanotechnolgy Reliability Solder Thermal analysis Underfill Wafer level packaging ASME's International Mechanical Engineering...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. December 2016, 138(4): 041009.
Paper No: EP-16-1090
Published Online: October 21, 2016
...; published online October 21, 2016. Assoc. Editor: Ashish Gupta. 25 07 2016 06 10 2016 3D packaging Chip stacking Composite materials Nanotechnolgy Reliability Thermal analysis Underfill Vertical integration of integrated circuits (ICs) is a key driver in orthogonal system...
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. June 2016, 138(2): 020804.
Paper No: EP-16-1006
Published Online: April 21, 2016
... was developed in-house by Siemens Microelectronics in 1987 to bond large area power thyristors on molybdenum substrates [ 6 ]. Their initial formulation of sintered Ag pastes consisted only of micron-sized Ag flakes and cyclohexanol [ 6 ]. Conductive adhesives Nanotechnolgy Power packaging Solder...
Journal Articles
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2016, 138(1): 010914.
Paper No: EP-15-1101
Published Online: March 10, 2016
... Microsystems Nanotechnolgy PWB Reliability SMT Impact loading is commonly seen in portable devices due to accidental drops. Relevant shock accelerations can reach up to tens of thousands of g's (“g” is the gravitational acceleration) [ 1 – 5 ], especially in the presence of secondary impacts...
Journal Articles
Publisher: ASME
Article Type: Review Articles
J. Electron. Packag. December 2015, 137(4): 040803.
Paper No: EP-15-1063
Published Online: October 9, 2015
.... 3D packaging Conductive adhesives Nanotechnolgy 01 07 2015 11 09 2015 Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the J OURNAL OF E LECTRONIC P ACKAGING . Manuscript received July 1, 2015; final manuscript received September 11...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2015, 137(3): 031014.
Paper No: EP-14-1043
Published Online: September 1, 2015
..., thermal stability after prolonged exposure to a high-temperature environment and thermal cycling tests shows limited deterioration for an array anchored using a silver-loaded thermal conductive adhesive (TCA). Nanotechnolgy Thermal analysis Many modern electronic components have a driving...
Journal Articles
Publisher: ASME
Article Type: Review Articles
J. Electron. Packag. March 2015, 137(1): 010801.
Paper No: EP-14-1069
Published Online: November 14, 2014
... back to the evaporator as shown in Fig. 1 [ 1 ]. 3D packaging Flexible circuits MEMS Microsystems Nanotechnolgy Thermal analysis Wafer level packaging 04 08 2014 10 10 2014 Contributed by the Electronic and Photonic Packaging Division of ASME for publication...