... ), a technique sometimes called picosecond ultrasonics. Experimental PPPT obtained on Si/SiGe superlattice structure covered by the 100 nm Al film 01 10 2007 08 09 2008 13 11 2008 atomic force microscopy integrated circuit reliability nanoelectronics nanowires phase...

... dispersive x-ray, atomic force microscopy, focused ion beam, and an Intellectest STORM series FA1500 shear tester were used as analytical tools in this study. The results suggest that the first zincation process follows the contour of the initial bond pad. The second zincation produces a slightly better...

... the effect of cleaning, various combinations of SPM and RCA were investigated (i.e., only SPM, only RCA, SPM after RCA, and RCA after SPM). Surface roughness before and after cleaning were analyzed by AFM (atomic force microscopy). Four-inch diameter borosilicate 7740 Pyrex glass wafers and Si wafers...

... atomic force microscopy integrated circuit reliability nondestructive testing correlation methods flip-chip devices image processing crack detection Quality and suitability of thermo-mechanical design and optimization of advanced electronic packages by means of finite element analysis (FEA...

... films permittivity surface topography atomic force microscopy surface chemistry X-ray photoelectron spectra integrated circuit technology As polymer dielectric materials appear to be the immediate successor to oxide interlevel dielectrics (ILDs), industry and academia have begun...