1-1 of 1
Keywords: scanning electron microscopy
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
ASME J of Nuclear Rad Sci. April 2021, 7(2): 024507.
Paper No: NERS-20-1158
Published Online: February 19, 2021
... exposures to supercritical water took place at 395 °C and 25 MPa in a supercritical water loop (SCWL). The duration of each exposure was 500, 150, and 1000 h. Scanning electron microscopy (SEM) with electron backscatter diffraction (EBSD), in combination with Raman spectroscopy (RS) and X-ray diffraction...