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Adam Dachowicz
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Journal Articles

Information Embedding for Secure Manufacturing: Challenges and Research Opportunities

Karim A. ElSayed, Adam Dachowicz, Mikhail J. Atallah, Jitesh H. Panchal
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Review Articles
J. Comput. Inf. Sci. Eng. December 2023, 23(6): 060813.
Paper No: JCISE-23-1078
https://doi.org/10.1115/1.4062600
Published Online: June 9, 2023
View Article titled, Information Embedding for Secure Manufacturing: Challenges and Research Opportunities
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Topics: Design, Manufacturing, Security
Journal Articles

Mission Engineering and Design Using Real-Time Strategy Games: An Explainable AI Approach

Adam Dachowicz, Kshitij Mall, Prajwal Balasubramani, Apoorv Maheshwari, Ali K. Raz, Jitesh H. Panchal, Daniel A. DeLaurentis
Journal: Journal of Mechanical Design
Publisher: ASME
Article Type: Research Papers
J. Mech. Des. February 2022, 144(2): 021710.
Paper No: MD-21-1200
https://doi.org/10.1115/1.4052841
Published Online: November 25, 2021
View Article titled, Mission Engineering and Design Using Real-Time Strategy Games: An Explainable AI Approach
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Topics: Design, Probability, Uncertainty, Uncertainty quantification, Damage
Journal Articles

Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing

Adam Dachowicz, Mikhail Atallah, Jitesh H. Panchal
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. October 2020, 20(5): 051004.
Paper No: JCISE-19-1299
https://doi.org/10.1115/1.4046891
Published Online: May 4, 2020
View Article titled, Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing
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Topics: Damage, String, Feature extraction, Construction, Security, Probability, Manufacturing
Proceedings Papers

Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing

Adam Dachowicz, Mikhail Atallah, Jitesh H. Panchal
Proc. ASME. IDETC-CIE2019, Volume 1: 39th Computers and Information in Engineering Conference, V001T02A065, August 18–21, 2019
Publisher: American Society of Mechanical Engineers
Paper No: DETC2019-98378
https://doi.org/10.1115/DETC2019-98378
View Paper titled, Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing
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Topics: Alloys, Manufacturing, Metals, Optical microscopy, Optimization, Security, String, Supply chains
Proceedings Papers

Optical PUF Design for Anti-Counterfeiting in Manufacturing of Metallic Goods

Adam Dachowicz, Mikhail Atallah, Jitesh H. Panchal
Proc. ASME. IDETC-CIE2018, Volume 1B: 38th Computers and Information in Engineering Conference, V01BT02A035, August 26–29, 2018
Publisher: American Society of Mechanical Engineers
Paper No: DETC2018-85714
https://doi.org/10.1115/DETC2018-85714
View Paper titled, Optical PUF Design for Anti-Counterfeiting in Manufacturing of Metallic Goods
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Topics: Design, Manufacturing, Damage, Steel, ASTM International, Electronics, Errors, Robustness, Supply chains
Journal Articles

Security in Cyber-Enabled Design and Manufacturing: A Survey

Siva Chaitanya Chaduvula, Adam Dachowicz, Mikhail J. Atallah, Jitesh H. Panchal
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Review Articles
J. Comput. Inf. Sci. Eng. December 2018, 18(4): 040802.
Paper No: JCISE-18-1038
https://doi.org/10.1115/1.4040341
Published Online: July 5, 2018
View Article titled, Security in Cyber-Enabled Design and Manufacturing: A Survey
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Topics: Security, Manufacturing, Design
Proceedings Papers

Confidentiality Management in Collaborative Design

Adam Dachowicz, Siva Chaitanya Chaduvula, Jitesh H. Panchal, Mikhail Atallah
Proc. ASME. IDETC-CIE2016, Volume 7: 28th International Conference on Design Theory and Methodology, V007T06A038, August 21–24, 2016
Publisher: American Society of Mechanical Engineers
Paper No: DETC2016-59222
https://doi.org/10.1115/DETC2016-59222
View Paper titled, Confidentiality Management in Collaborative Design
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Topics: Design, Collaboration, Tradeoffs, Engineering design, Intellectual property, Leakage