1-19 of 19
Justin R. Serrano
Close
Save search
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Effect of Gamma-Ray Irradiation on the Thermal Contact Conductance of Carbon Nanotube Thermal Interface Materials

Stephen L. Hodson, Robert A. Sayer, Timothy P. Koehler, Justin R. Serrano, Scott M. Dalton, Timothy S. Fisher
Proc. ASME. IMECE2013, Volume 8B: Heat Transfer and Thermal Engineering, V08BT09A018, November 15–21, 2013
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2013-62773
https://doi.org/10.1115/IMECE2013-62773
View Paper titled, Effect of Gamma-Ray Irradiation on the Thermal Contact Conductance of Carbon Nanotube Thermal Interface Materials
Open the PDF for Effect of Gamma-Ray Irradiation on the Thermal Contact Conductance of Carbon Nanotube Thermal Interface Materials in another window
Topics: Carbon nanotubes, Contact resistance, Gamma rays, Irradiation (Radiation exposure), Temperature, Density, Design, Electronic systems, Flow (Dynamics), Heat
Journal Articles

Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges

Timothy S. English, Leslie M. Phinney, Patrick E. Hopkins, Justin R. Serrano
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research-Article
J. Heat Mass Transfer. September 2013, 135(9): 091103.
Paper No: HT-12-1408
https://doi.org/10.1115/1.4024357
Published Online: July 26, 2013
View Article titled, Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges
Open the PDF for Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single-Crystal Silicon Microbridges in another window
Topics: Silicon, Temperature, Thermal conductivity, Crystals, Mean free path, Phonons
Proceedings Papers

Raman Thermometry and Thermal Modeling of Highly Doped Silicon-on-Insulator Joule Heated MEMS Bridges Under Varying Gas Pressures

Justin R. Serrano, Edward S. Piekos, Leslie M. Phinney
Proc. ASME. HT2012, Volume 1: Heat Transfer in Energy Systems; Theory and Fundamental Research; Aerospace Heat Transfer; Gas Turbine Heat Transfer; Transport Phenomena in Materials Processing and Manufacturing; Heat and Mass Transfer in Biotechnology; Environmental Heat Transfer; Visualization of Heat Transfer; Education and Future Directions in Heat Transfer, 525-531, July 8–12, 2012
Publisher: American Society of Mechanical Engineers
Paper No: HT2012-58114
https://doi.org/10.1115/HT2012-58114
View Paper titled, Raman Thermometry and Thermal Modeling of Highly Doped Silicon-on-Insulator Joule Heated MEMS Bridges Under Varying Gas Pressures
Open the PDF for Raman Thermometry and Thermal Modeling of Highly Doped Silicon-on-Insulator Joule Heated MEMS Bridges Under Varying Gas Pressures in another window
Topics: Bridges (Structures), Joules, Microelectromechanical systems, Modeling, Silicon-on-insulator, Temperature measurement, Temperature, Simulation, Heat transfer, Pressure
Proceedings Papers

Thermal Conductivity of Single-Crystal Silicon Microbridges Measured by Electrical Resistance Thermometry and Time-Domain Thermoreflectance

Timothy S. English, Leslie M. Phinney, Patrick E. Hopkins, Justin R. Serrano
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 713-722, March 3–6, 2012
Publisher: American Society of Mechanical Engineers
Paper No: MNHMT2012-75179
https://doi.org/10.1115/MNHMT2012-75179
View Paper titled, Thermal Conductivity of Single-Crystal Silicon Microbridges Measured by Electrical Resistance Thermometry and Time-Domain Thermoreflectance
Open the PDF for Thermal Conductivity of Single-Crystal Silicon Microbridges Measured by Electrical Resistance Thermometry and Time-Domain Thermoreflectance in another window
Topics: Crystals, Electrical resistance, Silicon, Temperature measurement, Thermal conductivity, Thermoreflectance, Temperature, Microelectromechanical systems, Modeling, Silicon-on-insulator
Journal Articles

Raman and Infrared Thermometry for Microsystems

Leslie M. Phinney, Wei-Yang Lu, Justin R. Serrano
Journal: Journal of Thermal Science and Engineering Applications
Publisher: ASME
Article Type: Research-Article
J. Thermal Sci. Eng. Appl. September 2013, 5(3): 031011.
Paper No: TSEA-11-1134
https://doi.org/10.1115/1.4023395
Published Online: July 15, 2013
View Article titled, Raman and Infrared Thermometry for Microsystems
Open the PDF for Raman and Infrared Thermometry for Microsystems in another window
Topics: Microactuators, Temperature, Temperature measurement, Microelectromechanical systems, Silicon-on-insulator
Proceedings Papers

Effects of Surface Roughness and Oxide Layer on the Thermal Boundary Conductance at Aluminum/Silicon Interfaces

Patrick E. Hopkins, Leslie M. Phinney, Justin R. Serrano, Thomas E. Beechem
Proc. ASME. IHTC14, 2010 14th International Heat Transfer Conference, Volume 6, 313-319, August 8–13, 2010
Publisher: American Society of Mechanical Engineers
Paper No: IHTC14-22268
https://doi.org/10.1115/IHTC14-22268
View Paper titled, Effects of Surface Roughness and Oxide Layer on the Thermal Boundary Conductance at Aluminum/Silicon Interfaces
Open the PDF for Effects of Surface Roughness and Oxide Layer on the Thermal Boundary Conductance at Aluminum/Silicon Interfaces in another window
Topics: Aluminum, Electrical conductance, Silicon, Surface roughness, Electromagnetic scattering, Radiation scattering, Scattering (Physics), Atomic force microscopy, Interfacial thermal resistance, Mean free path
Proceedings Papers

Raman and Infrared Thermometry for Microsystems

Leslie M. Phinney, Wei-Yang Lu, Justin R. Serrano
Proc. ASME. AJTEC2011, ASME/JSME 2011 8th Thermal Engineering Joint Conference, T30006, March 13–17, 2011
Publisher: American Society of Mechanical Engineers
Paper No: AJTEC2011-44097
https://doi.org/10.1115/AJTEC2011-44097
View Paper titled, Raman and Infrared Thermometry for Microsystems
Open the PDF for Raman and Infrared Thermometry for Microsystems in another window
Topics: Microelectromechanical systems, Temperature measurement, Microactuators, Silicon-on-insulator, Data collection, Resolution (Optics), Measurement uncertainty, Temperature, Temperature profiles
Journal Articles

Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model

Patrick E. Hopkins, Leslie M. Phinney, Justin R. Serrano
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Briefs
J. Heat Mass Transfer. April 2011, 133(4): 044505.
https://doi.org/10.1115/1.4002778
Published Online: January 14, 2011
View Article titled, Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model
Open the PDF for Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model in another window
Topics: Electrons, Relaxation (Physics), Thermoreflectance, Electron emission, Thin films
Proceedings Papers

Dimensionality Analysis of Thermal Transport in Multilayer Thin Film Systems

Patrick E. Hopkins, Justin R. Serrano, Leslie M. Phinney, Sean P. Kearney, Thomas W. Grasser, C. Thomas Harris
Proc. ASME. IMECE2009, Volume 12: Micro and Nano Systems, Parts A and B, 993-1001, November 13–19, 2009
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2009-12238
https://doi.org/10.1115/IMECE2009-12238
View Paper titled, Dimensionality Analysis of Thermal Transport in Multilayer Thin Film Systems
Open the PDF for Dimensionality Analysis of Thermal Transport in Multilayer Thin Film Systems in another window
Topics: Thin films, Heating, Probes, Pumps, Thermoreflectance, Top-tensioned risers, Transients (Dynamics), Accounting, Electrical conductance, Errors
Journal Articles

Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating

Patrick E. Hopkins, Justin R. Serrano, Leslie M. Phinney, Sean P. Kearney, Thomas W. Grasser, C. Thomas Harris
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2010, 132(8): 081302.
https://doi.org/10.1115/1.4000993
Published Online: May 20, 2010
View Article titled, Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating
Open the PDF for Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating in another window
Topics: Electrical conductance, Heating, Lasers, Probes, Pumps, Thermal conductivity, Thermoreflectance, Thin films, Top-tensioned risers, Heat conduction
Journal Articles

Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr

Leslie M. Phinney, Justin R. Serrano, Edward S. Piekos, John R. Torczynski, Michael A. Gallis, Allen D. Gorby
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. July 2010, 132(7): 072402.
https://doi.org/10.1115/1.4000965
Published Online: April 28, 2010
View Article titled, Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr
Open the PDF for Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr in another window
Topics: Bridges (Structures), Finite element analysis, Heat transfer, Microelectromechanical systems, Pressure, Simulation, Temperature, Temperature measurement, Heat conduction, Temperature profiles
Proceedings Papers

Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 to 625 Torr

Leslie M. Phinney, Justin R. Serrano, Edward S. Piekos, John R. Torczynski, Michael A. Gallis, Allen D. Gorby
Proc. ASME. HT2009, Volume 2: Theory and Fundamental Research; Aerospace Heat Transfer; Gas Turbine Heat Transfer; Computational Heat Transfer, 389-398, July 19–23, 2009
Publisher: American Society of Mechanical Engineers
Paper No: HT2009-88583
https://doi.org/10.1115/HT2009-88583
View Paper titled, Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 to 625 Torr
Open the PDF for Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 to 625 Torr in another window
Topics: Bridges (Structures), Engineering simulation, Microelectromechanical systems, Simulation, Temperature measurement, Pressure, Finite element analysis, Finite element model, Heat transfer, Materials properties
Proceedings Papers

Thermal Models for Determining Thermal Conductivity and Thermal Boundary Conductance Using Pump-Probe Thermoreflectance Techniques

Patrick E. Hopkins, Justin R. Serrano, Leslie M. Phinney
Proc. ASME. HT2009, Volume 1: Heat Transfer in Energy Systems; Thermophysical Properties; Heat Transfer Equipment; Heat Transfer in Electronic Equipment, 497-503, July 19–23, 2009
Publisher: American Society of Mechanical Engineers
Paper No: HT2009-88269
https://doi.org/10.1115/HT2009-88269
View Paper titled, Thermal Models for Determining Thermal Conductivity and Thermal Boundary Conductance Using Pump-Probe Thermoreflectance Techniques
Open the PDF for Thermal Models for Determining Thermal Conductivity and Thermal Boundary Conductance Using Pump-Probe Thermoreflectance Techniques in another window
Topics: Electrical conductance, Probes, Pumps, Thermal conductivity, Thermoreflectance, Locks (Waterways), Signals, Top-tensioned risers, Heating, Thin films
Proceedings Papers

Micro-Raman Thermometry of Laser Heated Surfaces

Justin R. Serrano, Leslie M. Phinney
Proc. ASME. InterPACK2007, ASME 2007 InterPACK Conference, Volume 1, 327-333, July 8–12, 2007
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2007-33571
https://doi.org/10.1115/IPACK2007-33571
View Paper titled, Micro-Raman Thermometry of Laser Heated Surfaces
Open the PDF for Micro-Raman Thermometry of Laser Heated Surfaces in another window
Topics: Lasers, Temperature measurement, Temperature, Polysilicon, Computer simulation, Data collection, Heating, Infrared imaging, Microelectromechanical systems, Microscopy
Proceedings Papers

Time-Resolved Micro-Raman Thermometry for Microsystems

Justin R. Serrano, Sean P. Kearney
Proc. ASME. IMECE2007, Volume 11: Micro and Nano Systems, Parts A and B, 1075-1079, November 11–15, 2007
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2007-43106
https://doi.org/10.1115/IMECE2007-43106
View Paper titled, Time-Resolved Micro-Raman Thermometry for Microsystems
Open the PDF for Time-Resolved Micro-Raman Thermometry for Microsystems in another window
Topics: Microelectromechanical systems, Temperature measurement, Resolution (Optics), Signals, Temperature, Transients (Dynamics), Actuators, Data collection, Microscale devices, Steady state
Proceedings Papers

Laser-Induced Damage of Polycrystalline Silicon Optically Powered MEMS Actuators

Justin R. Serrano, Leslie M. Phinney, Carlton F. Brooks
Proc. ASME. InterPACK2005, Advances in Electronic Packaging, Parts A, B, and C, 761-766, July 17–22, 2005
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2005-73322
https://doi.org/10.1115/IPACK2005-73322
View Paper titled, Laser-Induced Damage of Polycrystalline Silicon Optically Powered MEMS Actuators
Open the PDF for Laser-Induced Damage of Polycrystalline Silicon Optically Powered MEMS Actuators in another window
Topics: Actuators, Damage, Lasers, Microelectromechanical systems, Polysilicon, Energy dissipation, Imaging, Irradiation (Radiation exposure), Micromachining, Waves
Journal Articles

Time-Resolved Micro-Raman Thermometry for Microsystems in Motion

Justin R. Serrano, Sean P. Kearney
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. December 2008, 130(12): 122401.
https://doi.org/10.1115/1.2976552
Published Online: September 16, 2008
View Article titled, Time-Resolved Micro-Raman Thermometry for Microsystems in Motion
Open the PDF for Time-Resolved Micro-Raman Thermometry for Microsystems in Motion in another window
Topics: Actuators, Microelectromechanical systems, Temperature, Temperature measurement, Signals, Lasers, Probes
Proceedings Papers

Optical Testing of Polycrystalline Silicon Flexure-Type Optical Actuators

Justin R. Serrano, Leslie M. Phinney
Proc. ASME. IMECE2006, Microelectromechanical Systems, 619-624, November 5–10, 2006
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2006-14950
https://doi.org/10.1115/IMECE2006-14950
View Paper titled, Optical Testing of Polycrystalline Silicon Flexure-Type Optical Actuators
Open the PDF for Optical Testing of Polycrystalline Silicon Flexure-Type Optical Actuators in another window
Topics: Actuators, Bending (Stress), Polysilicon, Testing, Displacement, Damage, Irradiation (Radiation exposure), Design, Lasers, Absorption
Journal Articles

Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress

Mark R. Abel, Samuel Graham, Justin R. Serrano, Sean P. Kearney, Leslie M. Phinney
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. March 2007, 129(3): 329–334.
https://doi.org/10.1115/1.2409996
Published Online: May 31, 2006
View Article titled, Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress
Open the PDF for Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress in another window
Topics: Calibration, Polysilicon, Spectral linewidth, Stress, Temperature, Temperature measurement, Uncertainty, Thermal stresses, Raman spectroscopy, Microelectromechanical systems